Test Method for Electronic Device on Condition of Small Sampling
Ze Cheng, Zhao Long Xuan, Wei Wang, Mao Sen Hao · Applied Mechanics and Materials · 2013
The traditional quality testing method does not apply for the new electronic device which have characters that high-value and small-count, take advantage of the small sampling theory, we can reduce the number of test sample significantly by using the Bayes method. In the processing of the experimental data, we can improve the accuracy of the quality assessment of electronic devices by using of the Bayes method and make full use the prior information.