Failure analysis of odd/even word-line failure to improve the endurance performance of a NAND Flash
Young Sun, Mark G. Zhang, Jossen Yu, Walden Dong, Wei-Ting Kary Chien · 2009
A full-flow failure analysis (FA) was introduced in this paper. From the FA, we resolved odd/ even word-line failure which lead to poor endurance performance of a NAND Flash. After removing this defect, the endurance performance of this NAND Flash is greatly enhanced.