Test generation for Gigahertz processors using an automatic functional constraint extractor
Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. Abraham · 1999
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious problem. One solution is a novel method for functional test generation in which a transformed module is built manually, and which embodies functional constraints described using virtual logic. Test generation is then performed on the transformed module using commercial tools and the transformed module patterns are translated back to the processor level. However, the technique is useful only if the virtual logic can be generated automatically. This paper describes an automatic functional constraint extraction algorithm and a procedure to build the transformed module. We describe the tool, FALCON, used to extract the functional constraints of a given embedded module fromaVerilog RTL model. The constraint extraction for embedded modules of benchmark processors using FALCON takes only a few seconds. We show that this method can generate functional patterns in a time several orders of magnitude less than one using a conventional, at view of the circuit. 1