Optimal morphological peak classification
Edward R. Dougherty, Yidong Chen · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1995
The morphological top-hat transform is often used to locate bright peaks in a gray-scale image. The method can be problematic when there are two classes of peaks, one corresponding to valid objects and the other to noise. The present paper employs Bayesian estimation in conjunction with a multinomial distribution corresponding to levels of peak heights in the top-hat image to arrive at an optimal conditional-expectation estimator for the number of images in a random sample of images that contain a given number of valid peaks.