Multithresholding for arithmetic logic pattern matching
W.P. Cheung, K.C. Li, C.K. Lee · Electronics Letters · 1993
A new multithresholding scheme is presented to improve the peak score in a noisy environment for a 2-D pattern searching system with multibit EXNOR proximity measure. This scheme combines the interclass thresholds and minimum noise error thresholds for robust recognition process.