Production Test Considerations for Mixed‐signal IC with Background Calibration
Takuya Yagi, Haruo Kobayashi, Yohei Tan, Satoshi Ito, Satoshi Uemori, Nobukazu Takai, Takahiro J. YAMAGUCHI · IEEJ Transactions on Electrical and Electronic Engineering · 2010
Abstract This paper proposes an improved method of background calibration that reduces the production testing time of mixed‐signal ICs. Production testing time typically consists of ‘calibration convergence time’ and ‘functional testing time’ following calibration convergence. The method of reducing calibration convergence time that is proposed here does not require an extra ADC operation for functional testing after calibration convergence, and can be implemented with a little additional on‐chip test‐support circuitry when testing is performed by an automatic test equipment (ATE). We discuss the application of this method to background calibration of pipelined ADCs, and present simulation results that demonstrate its effectiveness in reducing testing time. Copyright © 2010 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.