A robust and fast line segment detector based on top-down smaller eigenvalue analysis
Dong N. Liu, Yongtao Wang, Zhi Tang, Xiaoqing Lu · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2014
In this paper, we propose a robust and fast line segment detector, which achieves accurate results with a controlled number of false detections and requires no parameter tuning. It consists of three steps: first, we propose a novel edge point chaining method to extract Canny edge segments (i.e., contiguous chains of Canny edge points) from the input image; second, we propose a top-down scheme based on smaller eigenvalue analysis to extract line segments within each obtained edge segment; third, we employ Desolneux et al.’s method to reject false detections. Experiments demonstrate that it is very efficient and more robust than two state of the art methods—LSD and EDLines.