Application of Self-Diagnosis on Automation Bench Test Platform
Xian Yang, Weijun Qin · ECS Transactions · 2013
This article is to introduce a novel concept in IC bench test with automation. A test platform was setup to perform the FPGA test. All the tests were automated controlled using python code with GPIB protocol. Self-diagnosis and adjusting method was introduced in the test. A Lattice FPGA device was used in the experiment. The result shows 94.9% failure can be identified using this platform. The fast bug identification and test adjust has been achieved. Meanwhile the self-adjust makes the 99.5% test pass rate without manually tuning which has reduced the retest time significantly.