Linearization of a nickel resistance temperature detector and its application in temperature measurement
Anwar A. Khan, A.R.M. Alamoud, M.A. Al-Turaigi · International Journal of Electronics · 1989
A theoretical study of a nickel resistance temperature detector (RTD) response linearization incorporating a new scheme, as well as conventional methods, is presented. The proposed scheme exhibits superior performance over conventional methods and offers linear temperature/voltage conversion over a wide dynamic range.