A stable key generation from PUF responses with a Fuzzy Extractor for cryptographic authentications
Masato Taniguchi, Mitsuru Shiozaki, Hiroshi Kubo, Takeshi Fujino · 2013
Physical Unclonable Functions (PUFs) extract inherent characteristics caused by fabrication process variations, and generate unique challenge-response pairs. Some bits of PUF responses are slightly unstable, then the Fuzzy Extractors (FEs) are used to correct the error bits. This paper proposes the new soft-decision FEs considering the instability caused by voltage fluctuation. We applied this method to our novel RG-DTM PUF fabricated by 0.18 μm CMOS technology. It was demonstrated that the block error rate is reduced to 1/10 compared to the conventional soft-decision FE.