Probability models for pseudorandom test sequences
Edward J. McCluskey, Samy Makar, Samiha Mourad, Kenneth D. Wagner · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988
A probabilistic model for pseudorandom testing of combinational circuits is presented. The expected fault coverage is shown to be accurately approximated as a series of exponentials that depends on the test length and the fault detectabilities. The derivations do not require the pattern generator to have the same number of stages as there are network inputs.>