A New LFSR Reseeding Method for BIST
Yong-zhi Yan, Hong Wang, Zhijia Yang, Yang Song · 2006
This paper presents a new BIST reseeding method that can significantly increase the ratio of test data compression using one LFSR seed to encode multiple deterministic test patterns. Experimental results on ISCAS89 benchmark circuits show that this method has about 30% reduction of the seed number