Scan-Based Speed-Path Debug for a Microprocessor
Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang · IEEE Design & Test of Computers · 2012
Identifying the actual speed limiting paths in silicon using traditional functional microprocessor tests can be very time-consuming and expensive because of limited observability of internal signals. This paper presents the development of a promising scan-based speed path diagnosis methodology and illustrates its application to a high performance microprocessor design.