Finding the information of the ellipse from the optical Hough transform
Sang-Gug Park, Sungyoung Kim, Jong‐Yun Kim, Soo-Joong Kim · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000
A new method to find five parameters of an ellipse from the optical Hough transform results is described. The method employs the Hough transform for detection of a straight line and the 1D analysis of the resultant parameter domain. By using this algorithm, we simulated about the ellipses with different positions, and we obtained the information of the ellipse with 94% accuracy in the worst case. To compare the simulation results with the experimental results, we performed optical experiments by using a HT CGH filter. Through the experiments, we showed that our results were very similar to those of the simulation results.