Functional test pattern generation for asynchronous circuits
Jar‐Shone Ker, Y.-H. Kuo, B.-D. Liu · 1993 IEEE International Symposium on Circuits and Systems · 2002
A functional test generation algorithm is developed. It generates test patterns directly from a graphical model, called the signal transition graph (STG). STG is used for the design and modeling of asynchronous circuits. Emphasis is placed on test generation for asynchronous circuits. A token propagation fault model is proposed to model the fault effects exhibiting on STG. The equivalence/dominance fault collapsing analysis is applied to reduce the number of faults to be considered.>