A high speed I/sub DDQ/ sensor for low-voltage ICs
Masaki Hashizume, Yoshio Miura, Masakazu Ichimiya, T. Tamesada, K. Kinoshita · 2002
A new high speed Built-In Current (BIC) sensor is proposed, which is applicable for I/sub DDQ/ tests of low power ICs. The layout of the sensor is designed with CMOS 1.2 /spl mu/m technology. By using this sensor, resistive bridging faults in a circuit, whose supply voltage is 3.3 V, can be detected at the test speed of 66.7 MHz.