Total-dose worst-case test vectors for logic faults induced in combinational circuits of cell-based ASICs
Ahmed A. Abou-Auf, Hamzah A. Abdel-Aziz, Mostafa M. Abdel‐Aziz · 2009
We developed a methodology for identifying worst-case test vectors for logic faults induced in combinational circuits of cell-based ASICs induced by total dose. This methodology is independent of the design tools and the process technology.