A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits
Y. YAMATO, Yusuke Nakamura, Kohei Miyase, Xianshan Wen, Seiji Kajihara · IEICE Transactions on Information and Systems · 2008
Per-test diagnosis based on the X-fault model is an effective approach for a circuit with physical defects of non-determinisa circuit with physical defects of non-deterministic logic behavior.However, the extensive use of vias and buffers in a deepsubmicron circuit and the unpredictable order relation among threshold voltages at the fanout branches of a gate have not been fully addressed by conventional per-test X-fault diagnosis.To take these factors into consideration, this paper proposes an improved per-test X-fault diagnosis method, featuring (1) an extended X-fault model to handle vias and buffers and (2) the use of occurrence probabilities of logic behaviors for a physical defect to handle the unpredictable relation among threshold voltages.Experimental results show the effectiveness of the proposed method.