Cross-correlation between i DD and v out signalsfor testing analogue circuits
José Machado da Silva, J.S. Matos, Ian M. Bell, Gaynor E. Taylor · Electronics Letters · 1995
The cross-correlation between iDD and vout signals is addressed as a means for improving the testing of analogue circuits. Besides the higher testing confidence provided by mixed iDD/vout monitoring, a single unified test operation is performed instead of two separate operations.