Statistics and Noise in a Quantum Measurement Process
Yuriy Makhlin, Gerd Schön, Alexander Shnirman · Physical Review Letters · 2000
We study the quantum measurement process by a single-electron transistor or a quantum point contact coupled to a quantum bit. We find a unified description of the statistics of the monitored quantity, the current, in the regime of strong measurement and derive the probability distributions for the current and charge in different stages of the process. In the parameter regime of the strong measurement the current develops a telegraph-noise behavior which can be detected in the noise spectrum. This description applies for a wide class of quantum measurements.