Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects
Yiwen Shi, Wan-Chan Hu, Jennifer Dworak · 2010
When testing resources are severely limited, special attention must be paid to critical faults so that important or frequent field failures arising from test escapes can be minimized. We present a new algorithm to optimize test sets that considers the criticality of potential undetected defects throughout the testing process and dramatically reduces the criticality of test escapes.