Automatic Data Recording System for Semiconductor Research
Jules J. Duga, J. J. Freundlich, Robert T. Bate · Review of Scientific Instruments · 1962
A completely programmable automatic data recording system has been constructed and is described in detail. Being originally designed for the measurement of the resistivity and Hall coefficient of semiconductors as functions of temperature, the system features: (1) a 100-step temperature detector to initiate a measurement cycle at a preselected temperature; (2) a 100-step input selector which can choose from up to 17 different voltages in a preprogrammed sequence and, in addition, can control environmental conditions; (3) a high-precision voltage amplifying and measuring system; and (4) an output selector containing appropriate binary-code translation circuitry and a combination typewriter-tape punch. The data are typed and simultaneously punched on tape in a desired format, and the tape information is converted to cards for data processing by a digital computer. The operation of each subsystem is described, and the over-all versatility is demonstrated by several different types of applications.