A 90nm CMOS cryptographic core with improved fault-tolerance in presence of massive defect density
Miloš Stanisavljević, Frank K. Gürkaynak, Alexandre Schmid, Yusuf Leblebici, Maria Gabrani · 2007
This paper presents the development methodology, circuit realization and measurement of a cryptographic core intended to operate reliably in the presence of massive defect density. A circuit-level voter based on averaging and thresholding has been implemented, and is measured to offer superior relia