I DDQ detectability of bridgesin CMOS sequential circuits
Rosa Rodriguez-Montanes, Joan Figueras · Electronics Letters · 1994
Differences between controllability conditions for IDDQ detectability in CMOS combinational and sequential circuits in the presence of bridging defects are presented. The usual detectability condition for current testability of bridges in combinational circuits is shown to fail for defective sequential circuits. New conditions for sequential circuits are presented.