A Scan-Testable 6000 Gate Array
P. A. B. Berendts · IEEE Transactions on Industrial Electronics · 1986
In this paper hardware and software aspects of the AGA6000 are described. The AGA6000 is the first member of a new family of Philips gate arrays. It is a high-speed double-layer metal gate array in which special flip-flop rows are implemented. These flip-flop rows automatically insert a scan path in a gate array design. A scan-path test vector generation program guarantees a complete hardware testing of the devices with a 100-percent fault coverage for single stuck-at-one/stuck-at-zero faults. This gate array family was announced in [1].