Implementation of VLSI self-testing by regularization
Y. You, John P. Hayes · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988
A novel circuit design methodology is developed for comprehensive offline self-testing of nearly regular VLSI circuits. It is based on four major design techniques: circuit partitioning, regularization to produce identical subcircuits (modules), parallel testing of modules, and fault detection by direct comparison of response streams from the modules. A generalization of I-testing called sequential I-testing (SI-testing) is described, which allows identical response streams to be produced at different times and be subsequently synchronized for comparison purposes. The concepts of k-regular and nearly k-regular circuits are introduced, which generalize regular circuits (iterative logic arrays) to array-like circuits that contain several cell-types and are moderately irregular. A heuristic circuit partitioning and regularization method for nearly-regular circuits is described.>