A sensitivity figure for yield improvement (manufacturable microwave circuit design)
John E. Purviance, Michael Meehan · IEEE Transactions on Microwave Theory and Techniques · 1988
A network sensitivity figure for use in gradient-type optimizers which accounts for random parameter variations encountered during manufacturing is introduced. The difference between conventional sensitivity descriptions and the authors' sensitivity figure is analyzed and explained. Two examples are presented where yield improvement is obtained using the new sensitivity figure in a gradient-type optimizer.>