Correction to “Generation Dependence of Retention Characteristics in Extremely Scaled NAND Flash Memory” [Sep 13 1139-1141]
Duckseoung Kang, Kyung-Hwan Lee, Seongjun Seo, Shinhyung Kim, Ji-Seok Lee, Dongseok Bae, Dong Hua Li, Yuchul Hwang, Hyungcheol Shin · IEEE Electron Device Letters · 2013
In the above paper (ibid., vol. 34, no. 9, pp. 1139-1141, Sep. 2013), the corresponding authors are not correctly indicated. Hyungcheol Shin is also an author to whom correspondence for the published letter should be directed toward.