Formulation of SOC Test Scheduling as a Network Transportation Problem
Sandeep Koranne, Vishal Choudhary · 2002
est resources, n is the set of tests and s is a source vertex. Each test vertex i has a terminal which has an associated demand b i of a commodity (the commodities # This work was performed when the author was with ED&T/Test, Philips Research. Email: [email protected]. are test bits). The edge set E is defined as follows; for each test t i n which can be executed with test resource m j we add an edge between vertex i and j. The capacity of this edge e ij is #. We add an edge e sj between s and each test resource j of capacity T# j1 w j for TAMs and T#wBIST j for BIST resources. Implementation: We have implemented a Test Planner Tool TFLOW with the Common Lisp language using the UFP algorithm of [1]. We compared the makespan length with ILP methods; the results are given in Table 1, executed on a Pentium IV machine with 128 MB of RAM. The table entries contain the makespan schedule in clock cycles. We improve upon the results of [2] not only in term of solution quality