Low-frequency capacitance measurements
L. Muzii, A Piccialli, S. Ravarino · Electronics Letters · 1975
The letter proposes a technique for the fast determination at extremely low frequencies of the capacitance and leakage components of capacitors. The proposed method permits the measurement of C and G in only a few cycles. An apparatus is described employing this technique for the automatic measurement of m.o.s. capacitance as a function of frequency and bias voltage.