Physically unclonable functions
Ingrid M.R. Verbauwhede, Roel Maes · 2011
CMOS process variations are considered a burden to IC developers since they introduce undesirable random variability between equally designed ICs. However, it was demonstrated that measuring this variability can also be profitable as a physically unclonable method of silicon device identification. This can moreover be applied to generate strong cryptographic keys which are intrinsically bound to the embedding IC instance. This holds a number of very interesting advantages in comparison to traditional forms of secure identification and key storage. In this work, we summarize and compare the different proposed constructions and are able to identify some generalizing properties for PUFs on silicon devices.