Implementation of an integrated FPGA based automatic test equipment and test generation for digital circuits
K. Vanitha, C. A. Sathiya Moorthy · 2013
The VLSI circuit manufacturers cannot guarantee defect-free integrated circuits (IC's). Circuit complexity, IC defect anomalies, and economic considerations prevent complete validation of VLSI circuits. The aim is to present the integrated automatic test equipment/generation System for digital circuits. The test generation is developed using device behavior and its based on Behavior-Based Automatic Test Generation (BBATG) technique. A behavior of a device is a set of functions with timing relations on its in/out pins. Automatic test Equipment which is the vital part of electronics test scene today provides the complete set of test executing software and test supporting hardware for the ATE which can use the BBATG generated test data directly to detect behavior faults and diagnose faults at the device level for digital circuits. The low cost, versatile and reconfigurable FPGA-based ATE is implemented called FATE to support in ASIC development phase. This provides the ideal solution for engineers to develop test programs and perform device tests and yield analysis on their desktop and then transfer the test program directly to production. Thus it could able to execute a preliminary digital test, using just a Laptop and an FPGA- board.