Minimum test patterns for residue networks
D. C. Bossen, Daniel L. Ostapko, A. M. Patel, M.S. Schmookler · 1971
Residue networks are logic trees consisting of residue gates which calculate the modulo-m sum of two or more inputs. The principal result of this paper is that for a single output residue network consisting of modulo-m gates having n or less inputs each, the required number of test patterns is mn, provided the gates are of a particular logical construction. This represents a minimum number of test patterns since that is exactly the number of test patterns required for a complete functional test of a single modulo-m gate with n inputs.