Edge detection based on wavelet analysis
Yan Ha, Xiaofei Wang · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2008
Edge detection is one of the most basic contents in image processing and identification and plays an important role in the image processing. A new edge detection method based on the multi-scale of wavelet analysis and improving the image segmentation of the best threshold is proposed. The characteristics of this new edge detection operator have been analyzed in this paper. The advantages and disadvantages between the new operator and those traditional edge detection operators have also been discussed.