Embedded Test Decompressor to Reduce the Required Channels and Vector Memory of Tester for Complex Processor Circuit
Yu Han, Yu Hen Hu, Xiaowei Li, Huawei Li, Anshuman Chandra · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2007
An embedded test stimulus decompressor is presented for the test patterns decompression, which can reduce the required channels and vector memory of automatic test equipment (ATE) for complex processor circuit. The proposed decompressor mainly consists of a periodically alterable MUX network which has multiple configurations to decode the input information flexibly and efficiently. In order to reduce the number of test patterns and configurations, a test patterns compaction algorithm, using CI-Graph merging, is proposed. With the proposed periodically alterable MUX network and the patterns compaction algorithm, smaller test data volume and required external pins can be achieved as compared to previous techniques