An Inspection Algorithm of Chip Component Type Based on Connected Region Labeling
Zujin Wang · Journal of Information and Computational Science · 2014
In order to automatically inspect chip components with the placement machine vision system, an algorithm based on connected region labeling is proposed to extract the features of chip components. Firstly, an image preprocessing method is dened to improve the quality of the lead part. On the basis of image preprocessing, in order to extract the overall and geometric features of a chip component, morphological connected region labeling and boundary extraction methods are adopted. In the feature extraction process, the inspection of chip component type is completed by using the extracted features sequentially. The experimental results show that the proposed algorithm can inspect various types of chip components with good accuracy.