Testing of complex gates
Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya · Electronics Letters · 1987
A systematic scheme for testing NMOS complex gates is presented. A minimal complete test set for all single and multiple detectable s-open, s-on and bridging faults is obtained. The scheme can easily be extended to test any general NMOS complex gate.