An experiment to profile the voltage, current and temperature behaviour of a P–N diode
Richard Opio Ocaya · European Journal of Physics · 2006
This paper describes an experiment that studies the effect of diode temperature and excitation current on forward diode voltage for a common silicon diode, the 1N4148. Experimental data are used to obtain a plausible model relating coefficient of voltage drift with temperature and its validity is then tested. The paper provides a reasonable temperature and current profile of the diode in forward bias. A practical design for a direct reading thermometer is also presented.