Study of Fourier descriptors statistical features
Ahmed Mohamed Darwish, Emad-Eldin H. Mohamed · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1993
In this paper we present a new approach to reduce the computations involved in recognition applications. Fourier descriptors are treated as a occurrence of a complex random variable. Statistical function measures are then used to characterize the behavior of the complex variable. A study of pattern regeneration based on these statistical features was carried out. Some of these statistical measures were found to comprehend most of the object global features. Thus, they could be used for classification and recognition purposes.