Implementation of parallelsite test on an 8-bit configurable microcontroller
Doug Mirizzi, W. Jerrels, D. Ohmart · 2002
This paper describes the process by which an 8-bit microcontroller was put into production test by testing four devices simultaneously. The test setup used was a pick and place handler, and a VLSI ATE (automated test equipment) tester. The process used to implement this new testing method is presented. Hardware and software constraints are explored, with an emphasis on the additional performance gained from out test system.>