Fault sampling revisited
Vishwani D. Agrawal · IEEE Design & Test of Computers · 1990
In the text, Test Generation for VLSI Chips (see IEEE Computer Society Press, 1988), V. Agrawal and S. Seth gave a formula for estimating fault coverage from the coverage analysis of randomly sampled faults that contains an error. A corrected formula for the sample size required for a given error tolerance in the measurement of fault coverage is given. Easy-to-use guidelines for analyzing fault coverage are presented.>