Easily-Testable (N, K) Shuffle/Exchange Networks.
David C. H. Lee, John Paul Shen · Proceedings of the International Conference on Parallel Processing · 1983
The authors focus on the testing of an important class of interconnection networks called (n,k) shuffle/exchange networks. A sequential circuit model is used for the basic switching element. A general fault model for the switching element is introduced. A testing strategy is presented which involves the exhaustive testing of each switching element without exhaustively testing the entire network. Each switching element is exhaustively tested via the application of a checking sequence. It is shown that the class of (n,k) shuffle/exchange networks is c-testable. A network is c-testable if it can be fully tested using a constant number of test patterns. A test sequence of constant length is constructed which when applied to a (n,k) shuffle/exchange network will fully test the entire network. 9 references.