Image Denoising in Industry Based on Multiwavelet Riesz Bases
Qi Chao Song, Zhi Song Liu, Chao Ping Wang · Advanced materials research · 2013
Damage testing of components is a key point in many industry fields. In some cases, endoscope is used to inspect the damage part, while the images are often noised. In this paper, we focus on industrial image denoising based on multiwavelet Riesz bases. Starting from compactly supported vector refinement equation, we provide a characterization to form two Riesz bases and an example is given. Based on example Riesz bases, we research industrial endoscope image denoising and get satisfying result.