A microprocessor-based static tester for digital integrated circuits
Ala A. Wahab, R. Nagarajan, Dakhil H. Jerew · International Journal of Electronics · 1983
A scheme for static testing of digital integrated circuits (ICs), using an Intel 8085 based development board is described. The data base required for the IC testing is designed to be suitable both for SSI and MSI circuits. The testing procedure does not assume any a priori knowledge of the IC under test, and requires only a minimum interaction of the operator with the testing equipment.