On the Complexity of Estimating the Size of a Test Set

Balakrishnan Krishnamurthy, Sheldon B. Akers · IEEE Transactions on Computers · 1984

Most NP-completeness results for test generation problems involve a reduction to the redundancy problem, which explicitly encodes the satisfiability problem. In this correspondence we investigate the complexity of a more modest problem-that of estimating the size of a test set under the constraint that the circuit is irredundant. We show that even this constrained problem is NP-hard in the strong sense.

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