In-sawing-lane multi-level BIST for known gooddies of LCD drivers
Chua‐Chin Wang, Chi-Feng Wu, Chen, Chia‐Hsiung Kao · Electronics Letters · 1999
Liquid crystal display (LCD) drivers usually operate at low speed, and have a low input-count but high output-count with multi-level voltages. A novel built-in-self-test (BIST) method for LCD drivers is proposed to reduce testing costs. This BIST circuit will be placed in the sawing lanes to reduce the chip area. The chip overhead and the testing costs are reduced, while the test coverage can be maintained.