Data analytic wavelet threshold selection in 2-D signal denoising
Michael L. Hilton, R. Todd Ogden · IEEE Transactions on Signal Processing · 1997
A data adaptive scheme for wavelet shrinkage-based noise removal is developed. The method involves a statistical test of hypotheses that takes into account the wavelet coefficients' magnitudes and relative positions. The amount of smoothing performed during noise removal is controlled by the user-supplied confidence level of the tests.