Automatic Transistor Alpha Measuring Set
D. E. Thomas, J. M. Klein · Review of Scientific Instruments · 1959
This paper describes an automatic transistor alpha measuring set which was designed for alpha curve tracing and fast acquisition of directly read values of alpha at discrete operating points on research models of junction transistors at an early stage in their fabrication. The set operates on a true null basis. Its calibration is therefore independent of normal variations of the measuring signal level, amplifier gains, and meter calibrations. Although the set described was designed primarily as an applied research tool, it is readily adaptable to automatic card punching of large masses of data or for rapid automatic selection of production transistors which meet specified limits at a discrete operating point or over a wide and continuous operating range. The automatic selection and card punching features can be combined for production quality control studies.