Control and observation structures for analog circuits
Yeong-Ruey Sheh, Cheng‐Wen Wu · IEEE Design & Test of Computers · 1998
No previously proposed analog built-in self-test method allows simultaneous control of all test points, the basic diagnosis capability required for analog circuits. This paper provides an approach that allows observation and control of DC voltage levels of all test points simultaneously, with a calibration process that ensures accuracy.