Universal and robust testing of stuck-open faults in Reed–Muller canonical CMOS circuits
Debesh Kumar Das, Susanta Kumar Chakraborty, Bhargab B. Bhattacharya · International Journal of Electronics · 2003
Testability of stuck-open faults in CMOS implementation of the Reed–Muller canonical (RMC) form of a switching function is considered in this paper. It is shown that a slightly modified RMC expression can be used to synthesize an easily testable combinational logic circuit. The design admits a universal test sequence TS that robustly detects all single stuck-open faults in the CMOS transistors. For an n-variable switching function, TS consists of only (2n + 8) vectors and can be generated by a simple test pattern generator. All single stuck-at faults in the corresponding gate-level description of the network are also detected by the same test set.